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Proceedings of the 1st European Test Conference


When test vectors are applied to a circuit, the fault coverage increases. The rate of increase, however, could be circuit-dependent. In fact, the actual rise of fault coverage depends on the characteristics of vectors, as well as, on the circuit. The paper shows that the average fault coverage can be computed from circuit testability. A relationship between fault coverage and circuit testability is derived. The mathematical formulation allows computation of coverage for deterministic and random vectors. Applications of this analysis include: determination of circuit testability from fault simulation, coverage prediction from testability analysis, prediction of test length, and test generation by fault sampling.


Published in Proceedings of the 1st European Test Conference, 1989. Copyright © 1989 IEEE. Used by permission.